| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ 2758-1987 |
Method of measurement by infrared interference for thickness of homoepitaxial layers |
180 (USD) |
via email in
1-3 business day
|
|
|
| SJ 20059-1992 |
Semiconductor discrete device-Detail specification for silicon NPN high-frequency low power transistor of Type 3DG111 |
150 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/Z 734-73 |
Preferred series and types for receiving tubes |
375 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 344-73 |
General specification for low noise travelling wave tubes |
120 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 366-73 |
Measurement of interelectrode leakage current of reflex klystrons |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 444-73 |
Methods of measurement for anode current and anode current on underheated condition of high-voltage rectifier tubes |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10573-1994 |
Detail specification for electronic components-Fixed precision resistors,Type RJ75 metal film precision resistors Assessment level E |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 3228.7-1989 |
Determination of Chromium in high purity arenaceous quartz |
30 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| SJ/T 10918-1996 |
Methods of measurement for camera tube yoke assemblies |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1542-1987 |
Method for chemical analysis of Nickel and Nickel alloy for vacuum tubes |
210 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1053-76 |
Reflex klystrons,Type K-27 |
180 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 433-73 |
Method of measurement for matching characteristics of O-type backward-wave tubes |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/Z 9010.17-1987 |
Measurements of electrical properties of electronic tubes and valves-Part 17: Methods of measurement for gasfilled tubes and valves |
375 (USD) |
via email in
1-3 business day
|
|
|
| SJ/T 10904-1996 |
Determination of fluorine in electronic glass - Specific ion electrode methods |
70 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2534.13-1987 |
Test procedures for antennas - Electromagnetic radiation hazards |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 20042-1992 |
Methods of measurement for tropsphering scattering communication equipment |
285 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1546-79 |
Continuous wave magnetrons,Type CK-140B |
90 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2585-1985 |
Reliability monitoring programs for use during research and development of radar equipment |
390 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 364-73 |
Measurement of cathode current of reflex klystrons |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11064-1996 |
Dumet wire |
105 (USD) |
via email in
1-3 business day
|
VALID
|
|
|
|
