| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ 1549-79 |
Silicon epitaxial wafers (Provisional) |
 (USD) |
via email in
1 business day
|
VALID
|
|
| GNZ 006.4-1982 |
|
 (USD) |
via email in
1-8 business day
|
VALID
|
|
| GB/Z 23693-2009 |
Project management - Areas of knowledge |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| SZ/T 1.3-2001 |
|
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 2902-1988 |
Registration,circulation and safekeeping of design documents |
 (USD) |
via email in
1-3 business day
|
|
|
| GB/T 37490-2019 |
Project, programme and portfolio management—Guidance on portfolio management |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11016-1996 |
Methods of analysis for pure silver brazing for electronic devices - Determination of bismuth (spectrophotometric strychnine-potasssium iodide method) |
 (USD) |
via email in
1 business day
|
ABOLISHED
|
|
| SJ/T 10861-1996 |
Test method for optical density of chrome blanks |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GNZ 006.1-1982 |
|
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 33290.5-2016 |
Specification for inspecting exit cultural relics—Part 5:Ceremonial article |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1802-1981 |
Electronic tubes,Type FU-113Z(F) |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10226-1991 |
Methods of determination for density of potassium silicate solution for use in electronic industry |
 (USD) |
via email in
1 business day
|
VALID
|
|
| T/BTSA 001-2016 |
|
|
via email in
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ/T 10860-1996 |
Test method for surface reflectivity of chromium film on chrome blanks |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1439-78 |
Pulsed magnetron,Type CKM-114B |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1388-1978 |
Methods of measurement for anode conductance of noise-generator diodes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| GB/T 37098-2018 |
Rating requirements for knowledge diffusion competence of innovation method |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 11080-1996 |
Dimensions of reference gauges for cathode-ray tubes |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| SJ/T 10149-1991 |
Graphic base of electronic components graphics of semiconductor discrete device |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 428-73 |
Methods of measurement for bandwidth of low noise travelling wave tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
|
|
