| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ/Z 1465-1979 |
Method of chemical analysis of ceramic blank |
660 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11024-1996 |
Methods of analysis for silver-copper brazing for electronic devices-Determination of antimony (spectrophotometric-atomic absorption method) |
95 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10227-1991 |
Methods of determination for viscosity of potassium silicate solution for use in electronic industry |
95 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1056-1976 |
Pulsed magnetrons,Type CKM-99 |
240 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11031-1996 |
Methods of analysis for gold-copper and gold-nickel brazing for elelctronic devices - Determination of phophorus (spectrophotometric method) |
184 (USD) |
via email in
1 business day
|
ABOLISHED
|
|
| SJ 439-73 |
Method of measurement for maximum oscillation starting current of O-type backward-wave tubes |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11026-1996 |
Methods of analysis for silver-copper brazing for electronic devices - Determination of iron, cadmium and zinc (spectrophotometric-atomic absorption method) |
104 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/Z 9021.2-1987 |
Mechanical standardization of semiconductor devices-Part 2:Dimensions |
2985 (USD) |
via email in
1-10 business day
|
ABOLISHED
|
|
| SJ 3244.4-1989 |
Methods of measurement for profile distribution of carrier concentration of Gallium arsenide and Indium phosphide materials-Electrochemical voltage capacitance method |
75 (USD) |
via email in
1-3 business day
|
|
|
| SJ 1.4-1987 |
Stages - Division and requirements for implementation of standards-preparation in electronic industry |
150 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1531-79 |
Contact diameter series for leading ring of ceramic-metal electronic tubes |
60 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10945-1996 |
Type designation system for alundum powder for vacuum tubes |
15 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 2534.5-1985 |
Test procedures for antennas-Special measurement techniques |
150 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2798-1987 |
Method for determination of particles in electronic grade gases-Light scattering method |
105 (USD) |
via email in
1-3 business day
|
|
|
| SJ/T 10343-1993 |
Organic film paint for black and white picture tubes |
120 (USD) |
via email in
1 business day
|
ABOLISHED
|
|
| SJ 2675-1986 |
Detail specification for electronic components-Fixed low-power non-wirewound resistors-Fixed metal film resistor,Type RJ17 Assessment level E |
135 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 438-73 |
Method of measurement for spurious oscillations signal-to-noise ratio of O-type backwave tubes |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1386-1978 |
Measurement conditions for noise-generator diodes and gas discharge noise tubes |
184 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10909-1996 |
Determination of K2O Na2O and Li2O electronic glass - Flame spectroscopy |
104 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 20018-1992 |
SJ 2001 8-1992 Detail specification for disk-seal tube of Type FM24 |
120 (USD) |
via email in
1 business day
|
VALID
|
|
|
|
