| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ 3249.1-1989 |
Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material |
120 (USD) |
via email in
1-3 business day
|
|
|
| MZ/T 128-2019 |
Transformation guidelines of geographical names from foreign languages into Chinese:Pushtu |
|
via email in
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ 1381-1978 |
Structure and technology of test diode |
490 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/Z 9008.6-1987 |
Measurement of electrical properties of microwave tubes-Part 7: Gas-filled microwave switching devices |
270 (USD) |
via email in
1-3 business day
|
|
|
| MZ/T 129-2019 |
Transformation guidelines of geographical names from foreign languages into Chinese:Malaysian |
|
via email in
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ 2715-1986 |
Character styles and symbols for electronic products |
135 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 10936-1996 |
Method of measurement for residue stress in color picture tube bulbs |
105 (USD) |
via email in
1-3 business day
|
|
|
| SJ/Z 9008.7-1987 |
Measurement of electrical properties of microwave tubes-Part 8: Backward-wave oscillator tubes-Otype |
90 (USD) |
via email in
1-3 business day
|
|
|
| SJ/T 10626-1995 |
Method for determining impurities in gold wire for semiconductor lead bonding by ICP-AES |
75 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1051-1976 |
Reflex klystrons,Type K-19 |
150 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1437-1978 |
Pulsed magnetron, Type CKM-104B |
130 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10864-1996 |
Measurement of electrical properties of disk-seal tubes-General |
60 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 20037.1-1994 |
Detail specification for Type LGA2A0410 fixed inductors |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 429-73 |
Methods of measurement for frequency ranges of low noise travelling wave tubes |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1549-79 |
Silicon epitaxial wafers (Provisional) |
90 (USD) |
via email in
1 business day
|
VALID
|
|
| GNZ 006.4-1982 |
|
1050 (USD) |
via email in
1-8 business day
|
VALID
|
|
| GB/Z 23693-2009 |
Project management - Areas of knowledge |
480 (USD) |
via email in
1-5 business day
|
VALID
|
|
| SZ/T 1.3-2001 |
|
135 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 2902-1988 |
Registration,circulation and safekeeping of design documents |
390 (USD) |
via email in
1-3 business day
|
|
|
| SJ/T 11016-1996 |
Methods of analysis for pure silver brazing for electronic devices - Determination of bismuth (spectrophotometric strychnine-potasssium iodide method) |
184 (USD) |
via email in
1 business day
|
ABOLISHED
|
|
|
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