| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ/Z 9067-1987 |
Implosion-protected cathode-ray tubes for television-type appliances |
255 (USD) |
via email in
1-3 business day
|
|
|
| SJ/T 10617-1995 |
Detail specification for electronic components-Fixed low-power non-wirewound fixed resistors-Type RT13 carbon film fixed resistors Assessment level E |
135 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| SJ/T 11018-1996 |
Methods of analysis for pure silver brazing for electronic devices-Determination of sulfur (iodimetric combustion method) |
184 (USD) |
via email in
1 business day
|
ABOLISHED
|
|
| SJ 1036-76 |
Low noise travelling wave tubes,Type B-1 |
180 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 450-73 |
Methods of measurement for anode dissipation power of high-voltage rectifier tubes |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/Z 330-72 |
Method of determination by metallurgical analysis of Nickel thickness of Nickel coated Iron strip |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11020-1996 |
Methods of analysis for silver-copper brazing for electronic devices - Determination of copper (iodimetric method) |
70 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10903-1996 |
Determination of boron oxide(B2O3) in electronic glass |
104 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10747-1996 |
Colour codes for wire leads of microwave devices |
60 (USD) |
via email in
1-3 business day
|
|
|
| SJ/Z 2782-1987 |
Method of analysis for overall activation process of non-evaporable getrters (catmasphere method) |
240 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 20017-1992 |
Detail specification for disk-seal tube of type FM22 |
130 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2656-1986 |
Method for defermination of Tungsten by spectrometry |
224 (USD) |
via email in
1 business day
|
VALID
|
|
| SZ/T 1.4-2001 |
|
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 2534.14-1985 |
Test procedures for antennas-Measurement of impedances |
60 (USD) |
via email in
1 business day
|
VALID
|
|
| GNZ 006.2-1982 |
|
30 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 10245-1991 |
Microwave ceramic dielectric materials-Microwave composite dielectric substrate |
115 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10867-1996 |
Measurements of electrical properties of disk-seal tubes-Methods of measurement resonator unloaded Q |
30 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 10087.4-1991 |
Methods of chemical analysis for glass raw materials for colour picture tubes-Methods for chemical analysis of limestone |
75 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 3228.8-1989 |
Determination of Alumiuium in high purity arenacous quartz |
75 (USD) |
via email in
1 business day
|
ABOLISHED
|
|
| SJ/Z 9013-1987 |
Measurements of incidental ionizing radation from electronic tubes |
120 (USD) |
via email in
1 business day
|
VALID
|
|
|
|
