| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| GB/T 1551-2009 |
Test method for measuring resistivity of monocrystal silicon |
360 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 32573-2016 |
Silicon powder—Determination of total carbon content—Infrared absorption method after combustion in an induction furnace |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 6616-2009 |
Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 20228-2006 |
Gallium arsenide single crystal |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 1553-2009 |
Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay |
240 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YS/T 1061-2015 |
Silicon core for polysilicon by improved siemens method |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 31474-2015 |
Soldering fluxes for high-quality interconnections in electronics assembly |
360 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 1554-2009 |
Testing method for crystallographic perfection of silicon by preferential etch techniques |
360 (USD) |
via email in
1-3 business day
|
VALID
|
|
|
|
