| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| YS/T 792-2012 |
Carbon-carbon composites crucible used in single crystal furnace |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 12964-1996 |
Monocrystalline silicon polished wafers |
150 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 14141-2009 |
Test method for sheet resistance of silicon epitaxial,diffused and ion-implanted layers using a collinear four-probe array |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 11094-2007 |
Horizontal bridgman grown gallium arsenide single crystal and cutting wafer |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 1558-1997 |
Test method for substitutional atomic carbon content of silicon by infrared absorption |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 13388-2009 |
Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 14144-2009 |
Testing method for determination of radial interstitial oxygen variation in silicon |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 26072-2010 |
Germanium single crystal for solar cell |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YS/T 988-2014 |
Carboxyethyl-germanium sesquioxide |
105 (USD) |
via email in
1 business day
|
VALID
|
|
| GB/T 24582-2009 |
Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 6618-2009 |
Test method for thickness and total thickness variation of silicon slices |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 29850-2013 |
Test method for measuring compensation degree of silicon materials used for photovoltaic applications |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 29057-2012 |
Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy |
300 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 29849-2013 |
Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 29508-2013 |
300 mm monocrystalline silicon as cut slices and grinded slices |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 32279-2015 |
Specification for order entry format of silicon wafers |
300 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YS/T 13-2015 |
|
240 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YS/T 989-2014 |
Germanium grain |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 34479-2017 |
Specification for alphanumeric marking of silicon wafers |
240 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 16596-1996 |
Specification for establishing a wafer coordinate system |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
|
|
