| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ 377-73 |
Measurement of frequency drift coefficient of reflex klystrons |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1392-78 |
Methods of measurement for excess noise power of noise-generator diodes |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1389-78 |
Methods of measurement for diodes leakage current between electrodes of noise-generator diodes |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1.11-1987 |
Provision and requirements for preparation and revision of technical standards for electronic industry-Requirements for contents of submitted reports concerning draft standards |
15 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11033-1996 |
Test method for density of electronic glass-Sink-float comparator method |
90 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 10719-1996 |
Examples for preparation of design documents used in esectronic equipments |
3195 (USD) |
via email in
1-10 business day
|
|
|
| SJ/T 11011-1996 |
Method of analysis for pure silver brazing for electronic devices - Determination of lead (spectrophotometric-dithizone method) |
184 (USD) |
via email in
1 business day
|
ABOLISHED
|
|
| SJ/T 10923-1996 |
Potassium silicate solution for use in electronic industry - Methods of determination of total alkalinity |
70 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1056-76 |
Pulsed magnetrons,Type CKM-99 |
240 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 376-73 |
Measuremnt of electronic tuning hysteresis of reflex klystrons |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 368-73 |
Measurement of power ripple ratio of reflex klystrons |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 3233-1989 |
Supports and glass bar of electron gun for vacuum electronic devices |
90 (USD) |
via email in
1-3 business day
|
|
|
| SJ/T 11032-1996 |
Methods of analysis for gold-copper and gold-nickel brazing for electronic devices-Determination of zinc (spectrophotometric atomic absorption method) |
60 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| SJ/T 10898-1996 |
Determination of iron oxide and titania in electronic glass - Photometric method |
104 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1437-78 |
Pulsed magnetron, Type CKM-104B |
135 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2154-1982 |
Miorocrystal glass substrates for use in thick film integrated circuits |
100 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1531-1979 |
Contact diameter series for leading ring of ceramic-metal electronic tubes |
130 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1667-1980 |
Electronic tubes,Type FM-12F |
224 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 979-1975 |
Electronic tubes,Type 6P13P(M) |
224 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 431-73 |
Methods of measurement for voltages and currents of O-type backward-wave tube on per-electrodes |
30 (USD) |
via email in
1 business day
|
VALID
|
|
|
|
