Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-steady-state surface photovoltage

YS/T 679-2008 Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-steady-state surface photovoltage
Standard No.:	YS/T 679-2008	Status:	ABOLISHED remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	8000 words	Translation Price:	240 (USD) remind me the price change Email:
Implemented on:	2008-09-01	Delivery:	via email in 1-3 business day
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Standard No.:	YS/T 679-2008
Chinese Name:	非本征半导体中少数载流子扩散长度的稳态表面光电压测试方法
English Name:	Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-steady-state surface photovoltage
Professional Classification:	H80 Semimetal and semiconductor material in general
Professional Classification:	YS Professional Standard - Non-ferrous Metal
ICS Classification:	29.045 Semiconducting materials
Issued by:
Issued on:	2008-03-12
Implemented on:	2008-09-01
Status:	ABOLISHED
Replace By:	YS/T679-2018
Replace By Date:
Target Language:	English
File Format:	PDF
Word Count:	8000 words
Translation Price:	240 (USD)
Delivery:	via email in 1-3 business day

YS/T 679-2008 The following standards are cited：

YS/T 679-2008 Cited by the following standards：