Test method for thickness of epitaxial layers—Stacking fault size

YS/T 23-2016 Test method for thickness of epitaxial layers—Stacking fault size
Standard No.:	YS/T 23-2016	Status:	VALID remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	6000 words	Translation Price:	180 (USD) remind me the price change Email:
Implemented on:	2016-09-01	Delivery:	via email in 1-3 business day
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Standard No.:	YS/T 23-2016
Chinese Name:	硅外延层厚度测定堆垛层错尺寸法
English Name:	Test method for thickness of epitaxial layers—Stacking fault size
Professional Classification:	H21 Metal physical property test method
ICS Classification:	77.040
Issued by:
Issued on:	2016-04-05
Implemented on:	2016-09-01
Status:	VALID
Replace:	YS/T23-1992
Target Language:	English
File Format:	PDF
Word Count:	6000 words
Translation Price:	180 (USD)
Delivery:	via email in 1-3 business day

YS/T 23-2016 The following standards are cited：

YS/T 23-2016 Cited by the following standards：