Method of measurement for reverse break-down voltage of semiconductor photodiodes

SJ 2214.4-1982 Method of measurement for reverse break-down voltage of semiconductor photodiodes
Standard No.:	SJ 2214.4-1982	Status:	ABOLISHED remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	1000 words	Translation Price:	184 (USD) remind me the price change Email:
Implemented on:	1983-07-01	Delivery:	via email in 1 business day
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Standard No.:	SJ 2214.4-1982
Chinese Name:	半导体光敏二极管反向击穿电压的测试方法
English Name:	Method of measurement for reverse break-down voltage of semiconductor photodiodes
Professional Classification:	M01 Technical management
Professional Classification:	SJ Professional Standard - Electronics
Issued by:	MOEI
Issued on:	1982-11-30
Implemented on:	1983-07-01
Status:	ABOLISHED
Replace By:	SJ/T 2214-2015
Replace By Date:
Target Language:	English
File Format:	PDF
Word Count:	1000 words
Translation Price:	184 (USD)
Delivery:	via email in 1 business day

SJ 2214.4-1982 The following standards are cited：

SJ 2214.4-1982 Cited by the following standards：